Under this project we are developing an electronic phase stepping method which replaces mechanical scanning of the key grating or grid components in x-ray phase contrast imaging. Preliminary results show that by replacing mechanical motion with electronic control, several advantages are gained, including reduced cost and system complexity, higher speeds and better accuracy and agility. This technology helps bridge the gap between the physics of grating-based phase contrast imaging and the established speed and operating environment of routine x-ray imaging applications.
|Znati, Sami A; Chedid, Nicholas; Miao, Houxun et al. (2015) Electrodeposition of Gold to Conformally Fill High Aspect Ratio Nanometric Silicon Grating Trenches: A Comparison of Pulsed and Direct Current Protocols. J Surf Eng Mater Adv Technol 5:207-213|
|Miao, Houxun; Gomella, Andrew A; Chedid, Nicholas et al. (2014) Fabrication of 200 nm period hard X-ray phase gratings. Nano Lett 14:3453-8|
|Wen, Han; Wolfe, Douglas E; Gomella, Andrew A et al. (2013) Interferometric hard x-ray phase contrast imaging at 204 nm grating period. Rev Sci Instrum 84:013706|