This sample preparation equipment includes a state-of-the-art ion mill, a specimen grinding system, and a new parallel electron energy loss spectrometer acquisition system to be used for hard and brittle samples prior to study in the existing transmission electron microscopes, scanning electron microscopes, and scanning auger spectrometer housed in the Microstructural Analysis Facility. %%% The Facility operates as a cost-center and includes two TEM's, two SEM's, two hot-stages, an evaporator, an electropolishing unit, an oven and grinding wheels for sample preparation. A new scanning Auger is being acquired. Two technicians operate and maintain the instruments, which primarily serve Materials Engineering, Electrical Engineering, Chemical Engineering, Physics and Chemistry Departments.
