X-ray imaging and inspection play an important role in the development and implementation of modern manufacturing techniques. The increasing demand for high-resolution inspection and inspection as adjuncts to critical manufacturing steps has generated a need for new, flexible, compact, high-resolution illumination sources. The use of thin-film convertors mounted on cooled diamond transmission substrates promises to open a broad range of new design techniques. This program will evaluate the feasibility of implementing these techniques and develop design parameters. A combination of modeling and experimental evaluation will be used to attack the critical problem of thin- film adhesion.
