A versatile high-resolution atom-probe field ion microscope with special features for in situ experiments which are not available on commercial instruments will be fabricated. The in situ features are: (a) vapor deposition; (b) ion irradiation or implantation; (c) oxidation of metals to create metal oxides -- i.e., metal oxide/metal interfaces; (d) electron irradiation of metal oxides to create point defects via electronic mechanisms; and (e) pulsed laser desorption. A group of four primary researchers will undertake research problems centered on the question of the relationship of chemical composition to the structure of an interface on a nanometer to subnanometer scale (<1 nm).