The equipment purchased from this grant will serve as a part of a general purpose computer-controlled acquisition system. The system will be capable of measuring both the admittance and network parameters of various devices, such as diodes, MOS capacitors, bipolar and MOS transistors, inductors, etc. The acquisition system will support a number of research projects primarily in the area of semiconductor devices. The examples of the projects include the investigation of heavy-doping effects in semiconductors and the development of models for computer-aided design of bipolar and MOS devices.
