This proposal solicits funding to obtain an X-ray Photoelectron Spectrometer (XPS) for a Surface Characterization Facility associated with the Center for Emerging Energy Technologies (CEET) at the University of New Mexico (UNM). X-ray photoelectron spectroscopy (XPS) is one of the only surface-specific spectroscopic techniques that provides readily interpretable, quantitative chemical information. Advances in instrumentation in the last decade mean that high spatial and energy resolution data can be acquired for the analysis of heterogeneous samples, including biointerfaces, complex composite materials, nanostructured materials, ceramics, and catalysts. A spatial resolution of several microns is possible in XPS images, while angle-resolved XPS (ARXPS) can be used for non-destructive depth profiling of the top ~ 8 nm of the sample. The applicants propose to replace the current XPS, a 12 year-old Kratos AXIS Ultra with a Kratos AXIS Ultra DLD. The current UNM Surface Characterization facility is the only XPS facility at an educational institution in the state of New Mexico, and is available to faculty throughout the state. Replacing this instrument thus impacts a wide range of research projects. The PI has over twenty years of experience with XPS and the development of methods for the analysis of complex samples, and the current facility manager will be supervising the establishment of the new Surface Characterization Facility.
