Thin coatings are applied to surfaces to prevent oxidation, to control radiation heat losses, to protect against corrosion, etc. The thermophysical properties of the coatings are needed for accurate design work. However, special techniques have to be employed for accurate determination of the properties. The proposed work is aimed at formulating and implementing a technique for the accurate measurements of the thermal diffusivity and thermal conductivity of thin-film coatings. Once developed, the technique will be applied to coating-substrate systems of industrial relevance.
