Professor McCluskey's research is in testing of VLSI circuits with a focus on topics in error detection and fault diagnosis. In error detection, he will study the phenomenon of transient errors by physical experiments, simulation and analysis. He is also investigating error detection through methods which involve verification of a problem answer. In fault diagnosis, he is developing test and diagnostic procedures that provide guaranteed fault coverage for various types of faults other than stuck-at faults. These include bridging, intermittent and delay faults. Methods of generating test patterns to detect complex faults are being investigated. Research is aimed at better techniques for network segmentation, pattern generation for segments, and generation of patterns either on the chip, on board or by program.
