This research is on developing algorithms and tools to synthesize testable digital sequential circuits. The testable synthesis problem has in the past been dealt with as two independent problems namely, the state assignment problem and the testing problem. Algorithms and tools that can synthesize area-efficient and testable designs of sequential circuits represented as finite state machines are being developed. Methods of partitioning and re-synthesizing large sequential circuits using the CAD tools and/or the test architectures developed in this project and generation of test vectors for the resulting circuits are being explored.

Agency
National Science Foundation (NSF)
Institute
Division of Computer and Communication Foundations (CCF)
Application #
9714034
Program Officer
John Cozzens
Project Start
Project End
Budget Start
1997-12-01
Budget End
2001-11-30
Support Year
Fiscal Year
1997
Total Cost
$196,000
Indirect Cost
Name
University of Wisconsin Madison
Department
Type
DUNS #
City
Madison
State
WI
Country
United States
Zip Code
53715