Investigations in three general areas in which scanning probe microscopy is employed for materials research: (i) fundamental studies of probe-surface interactions to enhance understanding of contrast mechanisms in imaging, (ii) trial applications in materials research, with special emphasis on imaging current transport paths, and (iii) development of gentler atomic force microscopes for soft materials, development of liquid nitrogen temperature microscopes, and development of atomic force microscopes with conducting tips for simultaneous imaging of surface topography and surface conductivity.
