The study of ultrathin film amorphous and microcrystalline semiconductors will be utilized to obtain basic information on the physical properties and structure of systems extending to submonolayer coverages. A combination of Raman scattering enhancement methods, ultraviolet photoemission measurements of changes in the density-of-states with island size, and additional discrete wavelength ellipsometry measurements for studying film growth all will be performed in situ. Emphasis will be placed on the use of high nucleation density disordered carbon substrates used previously in studies of crystalline transition metals. Raman scattering methods will also be utilized to study clusters isolated in weakly interacting substrates. The basic goal of these studies is to obtain information on finite size effects and modified surface bonding on the vibrational, electronic and optical properties of semiconducting cluster systems.

Agency
National Science Foundation (NSF)
Institute
Division of Materials Research (DMR)
Application #
8922305
Program Officer
H. Hollis Wickman
Project Start
Project End
Budget Start
1990-04-15
Budget End
1994-03-31
Support Year
Fiscal Year
1989
Total Cost
$265,000
Indirect Cost
Name
Pennsylvania State University
Department
Type
DUNS #
City
University Park
State
PA
Country
United States
Zip Code
16802