Experiments are directed towards understanding various aspects of the electronic structure of solids using Inelastic Electron Scattering (IES) AND Soft X-ray Emission (SXE) Spectroscopy. The electronic excitations over a wide energy range are measured which allows Kramers-Kronig analyses of the data to be carried out. Dynamical effects may be obtained by studying the momentum-transfer dependence of the Spectral features. The systems utilized have several unique features, which include low temperature sample holders, in situ ion cleaning and Auger analysis, and sample changers which do not disturb the UHV environment. Instrumental development is a complementary aspect of the program. In addition, studies are made using synchrotron sources at NIST and NSLS.

Agency
National Science Foundation (NSF)
Institute
Division of Materials Research (DMR)
Application #
9120055
Program Officer
Jean Toulouse
Project Start
Project End
Budget Start
1992-05-01
Budget End
1996-04-30
Support Year
Fiscal Year
1991
Total Cost
$270,000
Indirect Cost
Name
University of Virginia
Department
Type
DUNS #
City
Charlottesville
State
VA
Country
United States
Zip Code
22904