Characterization of materials and measurement of semiconductor device parameters are an important part of undergraduate microelectronics laboratory. This project enhances the analytic facilities of the laboratory through the addition of a semiconductor parameter analyzer. This system enables the students to characterize the electronic properties of the materials, and also to test and measure their fabricated devices parameters. The unit is used in five undergraduate courses in Electrical Engineering. The award is being matched by an equal amount from the principal investigator's institution.
