This project provides undergraduate students with hands-on experiences in inspection techniques in this institution's semiconductor manufacturing training program. The Microelectronics Technology certificate and degree programs are designed to prepare students for entry-level positions in the semiconductor manufacturing and production industry. The testing and validation equipment supported by this grant include: optical inspection stations (used visually demonstrate the impacts of particle contamination and to inspect mask openings, wafers, completed circuits, etc.), scanning electron micorscopes (used to observe film quality and othe photolithography properties), profilometers (used to measure oxide layer properties), film thickness gauges, and other equipment to provide students with state-of-the-art experiences relating to semiconductor manufacturing.

Agency
National Science Foundation (NSF)
Institute
Division of Undergraduate Education (DUE)
Type
Standard Grant (Standard)
Application #
9751054
Program Officer
Russell L. Pimmel
Project Start
Project End
Budget Start
1997-08-15
Budget End
1999-07-31
Support Year
Fiscal Year
1997
Total Cost
$50,000
Indirect Cost
Name
Northern New Mexico College
Department
Type
DUNS #
City
Espanola
State
NM
Country
United States
Zip Code
87532