The objective of this research is to develop a multifunctional nanoscale measurement system to explore geometric, electronic, dielectric and ferroelectric, optical, thermal, and chemical properties of individual nanostructures in a correlated manner. The approach is to integrate nanoscale characterization and fabrication capabilities in a single laser-assisted scanning probe microscope system with a spatial resolution on the order of nanometers. Individual nanostructures and devices can be diagnosed to find their correlated physical and chemical properties in a single experiment. The instrument to be developed will allow researchers to obtain detailed local information on material composition, structure, and function, allowing better understanding of the nanoscale properties of materials. The instrument functions can be performed sequentially on the same sample spot, allowing manipulation and characterization of multifunctional nanoscale materials.
The development of the proposed instrument will benefit the research community in nanotechnology by enhancing the integration of research with student education in electrical engineering, mechanical engineering, and physics at postdoctoral, graduate student, undergraduate student, and K-12 teacher and student levels. The successful development of this instrument will also open many opportunities in nanoscience/ technology in the United States and reduce the gap with Europe in the area of nanoscale characterization. The research results will be disseminated by annual conferences, journals, and the project website.
