Electronic systems based on Very Large Scale Integration (VLSI) have become increasingly complex. Evolutionary and revolutionary advances in process control, CAD layout software, and semiconductor device physics have allowed circuit designers to place an ever increasing number of devices on a single chip. In addition, the band width Hx VLSI circuits is increasing as well. All these advances have led to increasing problems with reliability and testability of VLSI circuits. The proposal addresses the problems of reliability and testability of VLSI circuits. The research program will continue ongoing research in the analysis of electronic performance of VLSI circuits and in the design and implementation of on-chip test and analysis circuits. In addition, the proposal addresses the problem of VLSI circuit failure due to ionizing radiation. The project will support the training of minority graduate students in this important area over a three year period.
