This award supports cooperative research between a U.S. scientist, Dr. Richard Vook, Syracuse University, and a Chinese scientist, Professor Zhang Jigao, Beijing Institute of Posts and Telecommunications, on "The Role and Formation of Thin Interfacial Layers in Sliding Electrical Contacts". This research will be carried out using facilities at both institutions. The goal of this joint research is to understand the formation and relevance of certain thin surface layers on electrical contact phenomena. By combining the expertise of Dr. Vook in surface science research and Professor Zhang in electrical contact research, it is anticipated that a productive multidisciplinary approach to the complex problems associated with sliding electrical contact phenomena will result.
