This scanning probe microscope will have both tunneling and scanning force heads and will be used for nanometer scale characterization of materials including solids, fractured materials, solid-fluid and solid-solid interfaces. The goal of the research projects for which it will be used is to measure both structure and electronic properties on the nanometer scale. This project is part of a research effort in the Washington State University Center for Materials Research which is focusing on the microstructural and microchemical properties of materials. Researchers from the departments of chemistry, physics, and mechanical and materials engineering departments will make use of this instrument. Initial experiments include (a) determination of nanostructure of thin films of metal nitrides, carbides, ferroelectric oxides, grown by ion beam enhanced techniques and by laser ablation; (b) observation of fracture and deformation induced features and structures, particularly in insulating materials, on an atomic scale -- including dislocation arrangements and the structure of interfaces; (c) studies of laser ablation of solid surfaces; and (d) determination of electronic properties of heterogeneous surface structures using scanning tunneling spectroscopy.