Zinc oxide varistors are commercially important discrete components used for surge protection of electronic circuits and electric machinery. The presence of deep electron traps within the zinc oxide grains could influence the response time by acting as one of the factors which might affect the rate at which the depletion zones surrounding the grain boundaries narrow prior to breakdown. Admittance spectroscopy will be used to characterize trap energy, density, emission rate, and capture cross section on commercial and specially fabricated varistors. The information will be correlated with I-V properties and voltage response times to meet the objective and, additionally, provide an extended understanding of electronic ceramics in general.
