The proposal is to develop a new approach to characterize the polarization parameters of optical and photonic materials using quantum feature of entangled and orthogonally polarized signal and idler photon pairs. A polarization intensity interferometer designed based on this principle has shown extremely high resolution in the attosecond time scale, and is sentive to the absorption or reflection of the photons travelling throught the sample. These features allow the use of this technique as a quantum extension of conventional optical ellipsometry.
