CTS - 9601680 Raul F. Lobo U of Delaware ABSTRACT Investigators interested in a broad range of advanced materials research including microporous inorganic catalysts and adsorbents, complex transition metal oxides, superconductors, semiconductor synthesis and characterization, photovoltaic cells and structural organomettallic chemistry, will use the new X-ray diffraction system extensively in their research. The instruments will be used primarily for the investigation of powders and thin films. The diffractometer brings together expertise from a variety of disciplines and will encourage and facilitate collaboration between different research groups. This new instrument solves a serious research infrastructure and educational limitation at the University of Delaware. ***
