Issues on performance and yield in defect- and fault-tolerant multiprocessors are being addressed in this research. Two different classes of multiprocessors are being considered in the research: shared-memory multiprocessors and multicomputer systems with local memory. Issues relating to metrics for capturing the most important properties of multiprocessors and algorithms for calculating the yield and performance of multiprocessors are being studied. The benefits and drawbacks of increasing the level of integration in the design of multiprocessors are being investigated. This research will result in an ability to determine the best level of integration for a given defect- and fault-tolerant multiprocessors system. Improvements in technology have reduced the defect density as well as the failure rates of all components in multiprocessing systems. However, the large increase in the number of components per system has more than offset the increase in yield and reliability of a single component. It is desirable that a given system have graceful degradation in performance in the presence of faulty components. The proposed research addresses the important issues of estimating performance and yield of multiprocessors and the benefits and drawbacks of increased level of integration. Results obtained will allow the design of more reliable and fault-tolerant multiprocessors. Support is strongly recommended.

Agency
National Science Foundation (NSF)
Institute
Division of Computer and Communication Foundations (CCF)
Application #
8805586
Program Officer
John R. Lehmann
Project Start
Project End
Budget Start
1988-09-01
Budget End
1992-02-29
Support Year
Fiscal Year
1988
Total Cost
$272,620
Indirect Cost
Name
University of Massachusetts Amherst
Department
Type
DUNS #
City
Amherst
State
MA
Country
United States
Zip Code
01003