9501499 Vinnakota This research is on analog circuit observer block (ACOB), structures for testing analog and mixed-signal circuits. Design styles for analog and mixed-signal ICs and their influences on testing the products are being studied. ACOBs for circuits of practical importance, both discrete and continuous time, are being investigated. A second exploration is into fault models for analog circuits which quantitatively link defects to variations in the functional parameters, which are traditionally verified in analog circuit test. These models are being used to validate the effectiveness of defect-oriented testing and design-for-test techniques, including ACOBs. The algorithms are being verified on practical circuits. Software for analog and mixed-signal test is being developed.
