This workshop is on evaluating priorities for research within the VLSI testing field, with the intention that the results of the meeting aid in refocusing the field on research necessary to algorithms, techniques and methodologies for testing deep submicron VLSI chips. Future priorities for research and education are considered. Research areas that are already well-served by the test communities in academia and industry and are unlikely to require major new methods or technological breakthroughs are being examined. The workshop report includes: (1) a statement of the most pressing problems to solve within the next decade, (2) recommendations regarding the style and kind of research to be conducted and suggestions to the community as to how to implement these suggestions, and (3) viewpoints on increasing the impact of the VLSI test field on education in electrical and computer engineering.
