With this award from the Major Research Instrumentation (MRI) Program, Professor Marya Lieberman from University of Notre Dame and colleagues Paul Bohn, Patricia Maurice, Peter Burns and Franklin Tao will acquire an X-ray Photoelectron Spectrometer (XPS). The award will enhance research training and education at all levels, especially in areas such as (a) semiconductor and polymer surface chemistry of "smart" materials, (b) studies of self-assembled monolayers, biomolecule/surface adhesion, (c) DNA damage and repair, (d) catalyst design and characterization as well as libraries of materials, (e) reaction mechanisms of catalysts, (f) surface chemistry of actinide minerals, and (g) soil and mineral surface chemistry.
X-ray photoelectron spectrometers are used for chemical analysis. The XPS technique quantitatively measures elemental composition, empirical formula, chemical state and electronic state of the elements in a given material. A sample is irradiated with a beam of monochromatic X-rays and the kinetic energies of the resulting photoelectrons are measured and related to specific elements. XPS often plays a crucial role in defining the system under study. The technique requires the use of ultra high vacuum conditions. The work to be carried out by these investigators represents a wide array of systems requiring surface characterization. The instrumentation will be used in research activities and also for research training and education of a large number of students from diverse backgrounds and will serve for outreach activities to neighboring institutions such as Saint Mary's College, Indiana University South Bend and Indiana University Northwest.
