This research project, under the direction of Professor Emile Schweikert of Texas A&M University, addresses the surface analysis of trace organics. The Analytical and Surface Chemistry Program supports these studies of secondary ion mass spectrometry using massive incident probe ions to enhance the yield of secondary ions, and thus increase the sensitivity of the method. Coincidence detection methods developed by Professor Schweikert are used to push the limits of detection in these measurements to the attomole level. Work is also underway to develop methods to improve the detection of secondary neutrals formed in these cluster ion surface collisions. The results of this work provide improved tools for the analysis of materials in the electronics industry and in the understanding of important environmental problems. The goal of this research project is to improve the methods available for qualitatively and quantitatively detecting organic materials at solid surfaces. These methods will be crucial to the improvement of electronic materials processing and to the analysis of environmentally and biologically important samples. Secondary ion mass spectrometry using mega-projectile incident ions, coupled with coincidence detection schemes promise a significant increase in sensitivity for these analysis methods.
