The purpose of this research is to investigate the feasibility of using ellipsometry to monitor the surface roughness of mechanical components. This technique relies on reflected light from a surface and is carried out under ambient conditions. Ellipsometry could potentially be used as a fast non-destructive evaluation of industrially produced surface finishes. This research plans to study the relationship between surface finish and ellipsometric parameters. Surface roughness is known to effect the changes in polerization state which occur when light is reflected from a surface. A recently available automated Muller Matrix ellipsometer permits the detection of depolarization and cross- polarization; two phenomena which are significant at roughness of practical surface. Professor Williams has a strong research background in ellipsometry. An award is recommended.
