This is a proposal to purchase a new electron microscope containing an integrated imaging electron energy spectrometer to replace an old microscope purchased in 1975. The electron energy spectrometer can be used in several modes. The simplest mode improves the acuity of images by removing inelastically scattered electrons from the imaging pathway. The contrast of images may also be changed by selecting electrons of different energy loss levels. A specific example of the usefulness of this feature is in the examination of plant or fungal cell wall structure. Because many cell wall components interact differently with electrons, the contrast between the different components can be enhanced by selecting particular energy windows to screen electrons. Improved penetration of label into tissue sections using boronated antibodies has been achieved using the electron energy spectrometer for detection. The new microscope will be the only electron microscope for the Plant Science Microscopy Facility.
