The Scanning Electron Micoscope is to be used as a major facilitfor the support of Materials Research at the University of Virginia. This facility will include capabilities for high resolution secondary and back scattered electron imaging, channeling, cathodoluminescence imaging, as well as wavelength and energy dispersive X-ray analysis. Current and planned research involves studies of 1) electrochemistry, electrocatalysis, and corrosoion, 2) environmental fatigue and fracture, 3) oxideation of alloys, 4) compositie materials, 5) processing of materials, 6) electronic materials and evices, 7) geochemistry and 8) light weight, high temperature alloys. The proposed facility is essential in the above research areas for the detailed characterization of topography, composition, orientation and perfection of the various materials studies.
