This research program will focus on the development and characterization of organic thin films deposited by thermal evaporation under vacuum. The project entails optimization of the thin film deposition process, structural studies of the organic films and systematic characterization of organic film- based structures. Measurements include current-voltage characteristics to understand physical processes of conduction and breakdown, capacitance-voltage characteristics to determine nature and density of surface states. The overall objective is to make a realistic assessment of potential applications of the thermally grown films in active electronic devices such as MIS structures.
