The goal of this research program is to develop and refine an instrument for the study of epitaxial magnetic thin films. Phase transition measurements will be used to determine the critical exponents of the films. This group is working to modify the physical properties of matter that affect the magnetic behavior of materials through a study of the relation between atomic level structure and magnetism. The instrument being developed will combine two complementary spin-sensitive spectroscopic techniques (Kerr effect and spin-polarized secondary electron emission) with MBE and thin film structure analysis capabilities (spot-profile analysis LEED and electron forward scattering spectroscopy). Scanning tunneling microscopy carried out on a separate system will be used to characterize the substrates.
