This research is for the development of advanced electron microscopy techniques and their use in material science. Specific techniques of interest are in-line holography in a scanning transmission electron microscope (STEM) and high-angle annular dark-field (HAADF) STEM imaging. In-line holography promises to be a feasible means to enhance STEM resolution without the requirement of higher accelerating voltage. HAADF imaging will be well suited to study crystal defects and surface layers. In particular, the above techniques will be applied to studying ferroelectric domain structures in thin crystals of barium titanate. The results of this research are expected to have a major impact on our ability to characterize technologically important material systems.
