This energy dispersive x-ray analyzer will convert the current electron microscope at Marquette University into an analytical microscope capable of chemical analysis of elements with atomic numbers greater or equal to 4, and capable of analyzing areas as small as 20 nm in diameter. The analyzer will be used in studies of diffusion induced grain boundary migration, liquid film migration in binary alloy systems to determine the alloy element concentration profiles behind boundaries and liquid films which have migrated; characterization studies of metal-oxide varistorboundary regions and phases; and characterization of microsegregation of metallic elements in rapidly solidified superconductors. In addition, students will be trained on this instrument. The analyzer will be shared by three groups, and made available to other users in engineering, physics, and chemistry on the campus, as well as interested local industrial groups.
