This project is an experimental study of scientifically and technologically important point defects in elemental and compound semiconductors using optical detection of magnetic resonance and optical detection of electron-nuclear double resonance. Some of the defects are produced by electron irradiation of Zinc-Tellurium samples at low temperatures. Another part of the work deals with metastable defects, such as DX and EL2 centers, in II-VI and III-V semiconductors. Other materials being studied are fullerenes, MBE nitrogen-doped Zinc-Selenium and porous silicon.

Agency
National Science Foundation (NSF)
Institute
Division of Materials Research (DMR)
Application #
9204114
Program Officer
H. Hollis Wickman
Project Start
Project End
Budget Start
1992-08-01
Budget End
1998-04-30
Support Year
Fiscal Year
1992
Total Cost
$615,000
Indirect Cost
Name
Lehigh University
Department
Type
DUNS #
City
Bethlehem
State
PA
Country
United States
Zip Code
18015