High resolution transmission electron microscopy (TEM) is a technique critical to the characterization of nearly all solid state materials. The 200 kev Hitachi HF-2000 field emission, analytical transmission electron microcope to be installed at the Microelectronics Research Center at Georgia Institute of Technology is a cutting edge instrument that combines state-of-the-art high- resolution capabilities with excellent analytical capabilities. Multidisciplinary materials research has emerged as a high-priority area of emphasis of both research and education at Georgia Institute of Technology over the past decade. Lack of such an instrument however has been a major limiting factor in the breadth and depth of the current and planned materials research program. Provision of this modern, research-grade TEM will facilitate the conduct of major research studies on a broad range of materials systems and structures. It will be made available throughout the Institute and utilized at four different levels: (a) by long-term professional microscopists responsible for operation, training, and collaborative research with faculty PI's; (b) by long-term student microscopists requiring TEM as a central part of their research; (c) by short-term student users for educational as well as data acquisition purposes; and (d) as a service to provide essential research data to PI's and students.
