The overall goal of this program is to explore the chemical and traditional synthesis, processing and microwave dielectric properties of novel ceramics in the system tantalum oxide-zirconium dioxide. The investigation will be conducted to gain deeper insights into the fundamental relationships between the atomic level defects, heterogeneous interfaces and dielectric properties. The measurement results of quality factor, dielectric constant and temperature coefficients of these properties will be correlated to the observed microstructure and the far infrared reflectance spectra. The program will establish the collaboration with engineers and scientists from industries and National Institute of Standards and Technology (NIST). The proposed work will explore the fundamental understanding and relationship between the atomic level defects, heterogeneous interfaces and microwave dielectric properties and its temperature dependence. The program will establish the collaboration with industries and government laboratories (NIST).
