This project investigates the electronic and magnetic properties of thin film structures, surfaces, and interfaces using recent progress in materials synthesis, advanced structure determination methods, and magnetically-sensitive spectroscopic and microscopic techniques. The principle scientific objectives are to explore the relationship between structure and magnetism on several length scales and to probe magnetic phenomenon in artificially-stabilized phases of ultra-thin films, interfaces, and nanostructures. The experiments address issues of current theoretical interest including the notion of 2-dimensional scaling universality classes and related scaling parameters. It is relevant to recent initiatives aimed at a broader commercialization of Magneto-resistance Random Access Memory (MRAM) technology %%% The fundamental understanding of the electronic and magnetic properties of thin film structures, surfaces, and interfaces is of current interest due to the recent initiatives aimed at a broader commercialization of Magneto-resistance Random Access Memory (MRAM) technology. The project addresses issues of current theoretical interest and exploits new advances in materials synthesis, novel structural determination methods, and state-of- the-art magnetically sensitive techniques to probe magnetic phenomena and phase transitions in artificially produced structures. The program is aimed at making major contributions to the local scientific/ technological infrastructure and to the Center for Advanced Microstructures (CAMD) at Baton Rouge, Louisiana. ***
