9732023 Williams This proposal by Professor Richard T. Williams of the Department of Physics of Wake Forest University describes a research program for the characterization of materials based on far-field optical microscopy. The goal is atomic scale identification and characterization of local and extended defects in inorganic materials. Specific phenomena which will be observed and studied by this technique include local diffusion of adsorbates in zeolites, single molecule imaging of fluorescent dyes in organic host matrices, Cesium 3+ clustering at interfaces of fluoride hosts, 3D mapping GaN/AlN films, and characterization of desorption -induced defects in ionic and semiconducting systems. The proposed work involves new, high-risk, high-payoff research. %%% This proposal by Professor Richard T. Williams of the Department of Physics of Wake Forest University describes a research program for the characterization of materials based on far-field optical microscopy. The goal is atomic scale identification and characterization of local and extended defects in inorganic materials. Specific phenomena which will be observed and studied by this technique include local diffusion of adsorbates in zeolites, single molecule imaging of fluorescent dyes in organic host matrices, Cesium 3+ clustering at interfaces of fluoride hosts, 3dimensional mapping Gallium-Nitride/Aluminum-Nitride films, and characterization of desorption -induced defects in ionic and semiconducting systems. The proposed work involves new, high-risk, high-payoff research. ***
