Students in biology, electrical engineering and other fields of study learn to use the Scanning Electron Microscope (SEM) for measurements related to their major area of study. A formal course that teaches students the principles of operation and the capabilities of the SEM as well as the procedures for using the instrument is offered on a regular basis. The particular instrument has several features that allow measurements not possible with instruments not possessing these features. After completing the course, the students have access to the SEM for individual project work. The grantee provides funds for this project that are an equal match for the NSF award.

Agency
National Science Foundation (NSF)
Institute
Division of Undergraduate Education (DUE)
Type
Standard Grant (Standard)
Application #
8851158
Program Officer
Joanne G. Rodewald
Project Start
Project End
Budget Start
1988-06-01
Budget End
1990-11-30
Support Year
Fiscal Year
1988
Total Cost
$66,422
Indirect Cost
Name
University of Massachusetts, Dartmouth
Department
Type
DUNS #
City
North Dartmouth
State
MA
Country
United States
Zip Code
02747