This project establishs a very-high-speed integrated circuit (VHSIC) testing laboratory for undergraduate electrical engineering students at the FAMU/FSU College of Engineering. This laboratory provides practical testing methodologies of VHSIC for senior-level students through a series of experiments which cover the fundamentals of functional and parametric testing. The laboratory supplements the undergraduate Microelectronics Program which includes courses in solid-state devices, digital and analog IC design, and the computer aided- design (CAD) of very large scale integration (VLSI) circuits. With the new equipment, the students study the switching characteristics of high-speed microelectronic devices belonging to logic families such as emitter-coupled logic (ECL), high- speed complementary-metal-oxide-semiconductor (HCMOS), and gallium arsenide (GaAs) metal-semiconductor field-effect transistors (MESFET). Electrical engineering majors completing the sequence of laboratory experiments gain a comprehensive knowledge of high-speed IC

Agency
National Science Foundation (NSF)
Institute
Division of Undergraduate Education (DUE)
Type
Standard Grant (Standard)
Application #
9152378
Program Officer
Duncan E. McBride
Project Start
Project End
Budget Start
1991-07-15
Budget End
1993-06-30
Support Year
Fiscal Year
1991
Total Cost
$27,257
Indirect Cost
Name
Florida Agricultural and Mechanical University
Department
Type
DUNS #
City
Tallahassee
State
FL
Country
United States
Zip Code
32307