The objective of this project is to study the electrical properties of single crystal junctions of Zn0 epitaxially grown on yttria stabilized Zr02 using AC impedance spectroscopy techniques. In AC impedance spectroscopy, the impedance of a sample is measured as a function of frequency, Z(w), and an equivalent circuit representation of the sample is developed using complex plane techniques. Each component in the equivalent circuit represents some physical parameter of the sample. Study of how the components vary with changes in experimental conditions provides insight into the physical processes that govern charge transport. The series of experiments that will be done to study the Zn0/Zr02 single crystal interface are, 1) Z(w) will be monitored as a function of temperature in an inert gas atmosphere, 2) Z(w) will be monitored as a function of applied bias voltage at constant temperature, and 3) Z(w) will be measured as a function of oxygen partial pressure at constant temperature. The results of this series of experiments will provide valuable insight into the nature of the charge transport process across solid semiconductor/electrolyte boundaries.
