This conference on "Scanned Probe Microscopies: STM and Beyond" under the sponsorship of the Engineering Foundation, will be held in Santa Barbara, CA, from 6-11 January 1991. The invention of the Scanning Tunneling Microscope has revolutionized surface science, by providing atomic resolution images of surfaces. It has also stimulated the development of a family of new microscopies based on the same approach: piezoelectrically-driven scanning of a probe tip over a surface with nanometer/angstrom precision. By utilizing different physical interactions between probe tip and sample, these new scanned probe microscopes have demonstrated a range of physical measurements, from topography and magnetic imaging to atomic-scale friction and optical imaging, all with unprecedented resolution. The objectives of this conference are: (1) To bring together a select group of people from diverse disciplines, not only those in the forefront of development of these microscopies, and those who have pioneered in their application of various fields, but also others whose research interests lie in areas of potential application; (2) To provide a conference format (a series of plenary sessions interspersed with time for informal discussion) which has proved successful, both in previous Engineering Foundation conferences and in the Gordon Conferences, in promoting synergistic interactions; and thereby (3) To simulate new directions in scanned probe microscopies and techniques, both in applications and in the underlying technologies.
