This U.S.-Bulgaria research project between Dr. J. Wayne Rabalais and Dr. S. S. Todorov of the Bulgarian Academy of Sciences will study the mechanism of low energy ion beam deposition (IBD) of artificially structured materials. The focus is the fundamental ion- surface interactions, including the influence of substrate structure, defects, diffusion, annihilation, and temperature along with ion energy, type, and charge. Deposition of two-component films will be studied by using a new, unique, pulsed, dual-beam, mass- selected ion beam deposition system. The films will be characterized in situ by electron spectroscopy and ion scattering and ex situ by XRD, TEM, RBS, and Raman. The objectives are to determine the mechanism of ion beam synthesis of epitaxial and ordered structures and new materials with interesting electrical and/or mechanical properties. The goal is to understand and control ion beam processes for low temperature synthesis of new multicomponent materials and metastable solids. This work should lead to an improvement of our fundamental understanding of film growth processes that occur during deposition of hyperthermal species and the resulting film structure and properties. This project in materials science fulfills the program objective of advancing scientific knowledge by enabling leading experts in the United States and Eastern Europe to combine complementary talents and pool resources in areas of strong mutual interest and competence.
