Sputter Initiated Resonance Ionization Spectroscopy (SIRIS), based on the concept of laser-induced resonance ionization of sputtered atoms, offers the potential to make in-situ chemical and isotopic microanalyses possible with excellent sensitivity to low concentrations and combined excellent spatial resolution. This project is a Phase I award under the Small Business Innovation Research Program that will test SIRIS methods for analysis of calcium and titanium isotopes in geological samples. The research plan is to assess interference problems from sputtered ions and nonresonant photo-ions and to identify analytical procedures for SIRIS analysis of calcium and titanium. The studies will form a basis for more general development of SIRIS microanalytical techniques for geological samples.

Agency
National Science Foundation (NSF)
Institute
Division of Industrial Innovation and Partnerships (IIP)
Type
Standard Grant (Standard)
Application #
8860854
Program Officer
Ritchie B. Coryell
Project Start
Project End
Budget Start
1989-01-01
Budget End
1989-09-30
Support Year
Fiscal Year
1988
Total Cost
$49,680
Indirect Cost
Name
Atom Sciences Inc
Department
Type
DUNS #
City
Oak Ridge
State
TN
Country
United States
Zip Code
37830