Radiation Monitoring Devices, Inc., is investigating the chemistry and physics of a new approach to detect synchrotron radiation which combines thin film semiconductor techniques with electrochemical panel technology to produce a large area detector with 100 m spatial resolution. This approach will lead to a detector with sufficient density to stop diffracted rays with high quantum efficiency while maintaining high flux performance and wide dynamic range. This innovative solid state position sensitive X-ray detector will have the performance needed to more fully utilize modern high intensity synchrotron sources.
