Lee The focus of this research is on a next generation fabrication technology for analog/digital converters and the demonstration of the integrability of the new technology through the implementation of a high-performance analog-digital converter. Research concentrates in two areas: l. BiCMOS Phase-locked Loop Designs. Testing of the first silicon containing transmit and receive phase-locked loops includes tests at 250 Mhz and a characterization of the master slave phase-lock technique, verification of the accuracy of the SPICE simulation and a check of injection locking. Based on the tests and evaluations, the complete system is then designed and implemented in a second chip design. 2. Integrated Capacitive Sensors and Circuits. Integrated capacitive pressure sensors are being fabricated and tested. Sigma-delta oversampling techniques in the readout are being investigated as a possible replacement for the successive approximation readout technique currently in use.
