This program addresses the relationship between the vertical eddy diffusion coefficient and environmental conditions by developing a profiling CTD system for rapid sampling aboard R/P FLIP. An existing CTD will be modified to enable high resolution profiles to be made to measure small scale overturns. These will be related to the eddy diffusion coefficient to determine the latter's dependence on depth, and Brunt-Vaisala frequency. A major deployment from FLIP is planned in the second year. It should result in thousands of profiles for analysis of mixing processes.
