This award supports one visit in the first year by Dr. Simon C. Moss, and one by post-doctoral researcher P.C. Chow, of the University of Houston, University Park, and one each in the second year, to CSIRO, Clayton, Victoria, Australia, to work with Dr. Stephen W. Wilkins of the Division of Materials Science and Technology on the Division of Materials Science and Technology on the x-ray microstructural characterization of thin films and multilayers of semiconductors produced by various means. The researchers intend to select a few materials for intensive study and join their respective instrumental and theoretical skills to develop new insights and analytical methods. The research topics include: (1) semiconductor multilayer (superlattice) structures; (2) studies of interfaces in incoherent structures; and (3) studies of ordering, vibrational effects and localized distortions within multilayer and thin-film structures. The three topics are somewhat interrelated in that they require very careful attention to data collection and to scattering theory.
